Cascade probe cards Apr 5, 2008 · Beaverton, OR - To address the critical need to reduce the cost of high-volume testing of RF devices for the mobile handset market, Cascade Microtech introduced recently a new Pyramid Probe card that brings high performance RF production test capability with over 50 percent cost of ownership savings over current approaches. On-wafer power device characterization up to 10,000 V DC; Safe and convenient integration kits to support T. Each probe card is carefully checked for planarity and with its individually spring loaded Beryllium-Copper tips, provides reliable contacts, even when probing non-planar structures. 5?wide, 0. The PAV200 is a highly-precise semi-automated probe station for wafers and substrates up to 200 mm in a vacuum environment down to < 1×10-4 mbar. Free shipping on many items | Browse your favorite brands Standard interface For MicroChamber, TopHat, probe card holders and custom adapters Platen Lift Type Precision 4-point linear lift Range 5. 15 in) from probe center to front/rear Complete solutions using probe positioners and probe cards Versatile microscope mount system for fine-structure and large-area probing Thermal range ambient to +300°C Experience the future of digital imaging. The PMV200 is a highly-precise probe station for wafers and substrates up to 200 mm in a vacuum environment down to < 1×10-4 mbar. Cascade’s high-density probe cores support >1,200 core I/Os, which is sufficient for WIO1. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz For robust, lower cost and long-life production testing of 57 GHz to 81 GHz RFICs, FormFactor’s Pyramid-MW Probe is the world’s only mm-wave (mmW) RF production probe card that ensures reliable and repeatable measurement results critical for high-yield testing. The cleaning frequency and intensity needed to keep a Pyramid Probe operating at its best are related to the probing environment itself. The HPD IQ3000 is a high precision fully automated probe station for 150 mm, 200 mm or 300 mm substrates in a 4 K environment. These probes offer stable and repeatable over-temperature measurements, with a typical probe life of 500,000 contacts on gold pads. Excellent measurement performance is achieved for a wide range of applications in an EMI-shielded, light-tight and moisture-free test environment, at a temperature range from -60°C to 300°C. The DCP-HTR probe delivers fA-level measurement capability from -65 °C to 300 °C for advanced characterization and reliability testing. 125" thick, up to 11. 40/80 Gb/s High Performance RF Quadrant • Pyramid Probe Cards – Parametric probe cards –30 probes – 100‐150 micron minimum pitch –Spring rates ~= 1. with safe, repeatable electrical contact. The DC probes use ceramic blade needles for low noise and high performance. The PLC50 is a highly-precise, cost-effective probe station for wafers and substrates up to 100 mm in a high vacuum environment, at cryogenic temperatures down to 77 K with liquid nitrogen or < 7 K with liquid helium. (NASDAQ: CSCD), a global supplier of production probe cards with industry-leading signal integrity for multi-site die testing, today announced S-Technology for improved contact physics. FormFactor uses MEMS to build millions of tiny robust electrical springs capable of testing ICs over more than a million contact cycles. Get the most out of your probe card. Get the best deals on Semiconductor Probes when you shop the largest online selection at eBay. Highly-precise manual probe platform for wafers & substrates up to 150 mm. Probe Scrub® Probe Scrub® removes embedded and bonded debris from the probe contact area and collects loose debris from the tip length. Also, verify that the pad footprint meets potential packaging requirements. To accelerate the realization of commercial quantum and superconducting computers, we provide chip developers with the tools they need to intelligently iterate on their designs. Cascade Microtech is unparalleled in providing on-wafer high frequency and parametric test solutions. Cascade Microtech’s Pyramid® Probes RBI Probe Cards and Cores Probe Card to Core Interface: Core-I/Os Mar 1, 1998 · To overcome these problems, several manufacturers produce non-needle-bearing probe cards in various forms. Current delivery time is four weeks for re-orders. FormFactor's Probe Station Accessory Catalog is a fully text-searchable document which lists pertinent information including features, benefits, station compatibility and ordering information for Cascade probe system accessories. 200 mm Semi-automated Probe Systems PA200 Cascade Features / Benefits Flexibility • Ideal for FA, RF, opto-engineering and MEMS tests • Large number of accessories available, e. Precise On-Wafer Device and Process Characterization. PA200 BlueRay is a 200 mm semi-/ fully-automated production probe system for high-throughput test of optoelectronics (LED), MEMS, and RF devices. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz cantilevered probe tips; vertical and area array probe card technologies with flat, pointed, and wedge style Cobra-style probes; and other advanced probe card technologies such as those built by FormFactor and Cascade MicroTech. Failure analysis with an optional laser cutter. • Pyramid Probe Cards – Parametric probe cards –30 probes – 100‐150 micron minimum pitch –Spring rates ~= 1. Equipped with new sensor technology and high-resolution optics, it is the perfect choice for ultra-precise on-wafer measurements, offering unsurpassed automation features that provide increased throughput and the highest productivity. net Cascade Microtechprobe 115-418 card holder for microchamber with clamp holder Back pivoting edge connector Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber in San Jose, CA, USA Different substrate carriers for wafers up to 200 mm or single dies Probe cards and/or up to eight positioners Probe positioners placed inside vacuum chamber FormFactor - Cascade PAV200 - 200 mm semi-automated vacuum probe system | PSI Solutions, Inc. P. Starting at $13,880. This video gives an overview of a typical calibration run at 1. S. , SWTW-2005 Miahle, et al. The system is based on a Cascade CM300 probe station from FormFactor and National Instruments PXI test instrumentation and FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. Simply choose a base station and add as many application-specific starter kits as you need. ) Max. Our families of RF, mixed-signal and DC probes are designed to meet the many challenges of the various probing environments and provide a durable, high-performance product that exceeds expectations. Sep 1, 2022 · In an earlier blog, we outlined four steps to take for off-line cleaning of your Pyramid Probe® Card. The ACP Quadrant Probes are customizable to fit your specific needs. <<ETX xmlns:mml Our network of test and measurement experts spans the globe, and we are available to help you achieve your next design breakthrough. 12 mils) Lift control Ergonomic handle with 90° stroke. Sep 28, 2010 · Cascade Microtech, Inc. ReAlign is the ideal tool for probe cards that do not allow viewing pads and probe tips from above. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz Advanced manual wafer probing in a high vacuum environment. • HTS probe card holder ensures EMI-shielded and light-tight environment, achieving accurate and reliable small-pad probing (option). - Probe Station Accessory Catalog Aug 16, 2017 · At a glance, you’ll notice its ultra-efficient, ergonomic design. Whether you need advice on selecting the right probe or purchasing a new system, or you need to collaborate on a new probe card design for next-generation devices, you can contact us today. FormFactor introduces a new modular concept for its best-in-class 150 mm probe stations. 52 KB The multi-contact Unity Probe provides highly flexible configurability, unprecedented durability and ease-of use for RFIC engineering test. This post on cleaning Pyramid Probe Cards walks you through 9 steps to help you determine cleaning parameters – your cleaning interval, number of touchdowns per clean, and cleaning overtravel. Probe card cleaning must: – reduce contact resistance – remove (stick) debris to avoid leakage – preserve original tip shape t s a f–be and repetitive – be friendly using (to be used by all operators) – clean all type PC technologies – use all type of cleaning material But probe card cleaning must not: FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. Learn More Enabling Technology. Unlike “bent-to-order” needle-probe solutions, Unity probes are quickly “built-to-order” with a precision tip cluster featuring multiple independently compliant fingers to isolate chip components from probing stresses — maximizing probe life and • Platen lift (up and down” for simultaneous separation of all probes Overview Cascade PMC200 probe system from FormFactor is the ideal solution for testing wafers and substrates up to 200 mm in a cryogenic environment. FormFactor - Cascade InfinityQuad - A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic 200 mm Probe Station for Collecting High-accuracy Measurement Data up to 5X Faster. Upon further inspection, you’ll discover exactly why the Elite300 is essential at 45nm and beyond. com. Probe Card noise and leakage current from -50 C to 150 C is <5 fA. Featuring next-generation, Pureline™ performance, the Elite 300 mm wafer probe station is the world’s lowest-noise probe station. Introducing the InfinityXT probe series. 2021. High-precision probe system that enables testing at multiple temperatures. 375?long Aug 14, 2017 · ISS Map 101-190 - ISS Map 101-190 Created: August 14, 2017 | Updated: October 21, 2019 | Type: pdf | Size: 369. Some of the rules can T. See full list on tmetrix. The ACP Probe delivers outstanding compliance for probing non-planar surfaces. MEMS probes are the integral elements of our advanced wafer probe cards. High probing angle and clearance; Advantages. FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. It features user replaceable fiber pigtails allowing the probe to be optimized for a variety of light delivery and light collection applications including the characterization of topside illuminated photodiodes, Vertical Cavity Surface Emitting Lasers (VCSELs), hybrid transmitters and Aug 16, 2017 · CM300xi Data Sheet. Akari probe cards, with both multi-site and single-site/2-pin options, deliver a high-precision test solution for LEDs. Manual and motorized probe positioners for any application from DC to terahertz measurements and beyond. Nov 7, 2019 · FormFactor’s Takao Saeki unveils Takumi CL, a new low-impact parametric MEMS probe card for low-leakage and small pad size applications. , SWTW The Parametric series Pyramid probe cards are the high performance, low-cost alternative to the existing solutions, compatible with all major parametric tester platforms, and designed to enable the accurate monitoring of 65 nm and 45 nm parametric test structures. 37 KB FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. The PMC200 is a highly-precise, advanced manual probe system for wafers and substrates up to 200 mm in a high vacuum environment, at cryogenic temperatures down to 77 K with liquid nitrogen or < 7 K with liquid helium. InfinityXT enhances and extends FormFactor’s industry-leading Infinity probe family, which has set the benchmark for accuracy and repeatability in the device characterization and modeling community for more than a decade. The design and performance characteristics of two implementations are summarized and the results of several applications are reviewed. Precise measurements for ultra-low noise, DC, RF, mmW and THz applications. The introduction of a high-performance W-band millimeter wave probe in 1992 established GGB Industries, Inc. May 31, 2024 · The cascade beatstick to end all cascade beatsticks, Apex Devastator may be the Timmiest card to ever Timmy: you literally cascade, cascade, cascade, and cascade. It can be easily configured for mixed-signal RF/mmW testing. Forward-Looking Statements Jul 6, 2021 · tag: probe cards. About Pyramid Probe Cards Pyramid probe cards are rugged, robust, and well suited for the rigors of high-performance production wafer sort. S-Technology provides a unique mechanical architecture for Pyramid Probe@ Velox WinCal eVue Microscope Positioners Chucks Vibration Isolation Tables ShieldEnclosure Custom Probe Systems Certified Used Equipment Trade-in/Buy Back Educational Savings Infinity Probe (145 GHz) InfinityXT Probe (110 GHz) |Z| Probe (67 GHz) |Z| Probe® Power T-Wave Probe (140 GHz-1. The new Cascade SUMMIT200 advanced 200mm probe system, is essential for collecting high accuracy measurement data on single or volume wafers; as fast as possible. Our most popular package, the combination of training and site evaluation will assist users in extending the life of the probe card to increase overall cost of ownership. Customize your 150 mm probe station based on flexible modules. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz FormFactor's Probe Station Accessory Catalog is a fully text-searchable document which lists pertinent information including features, benefits, station compatibility and ordering information for Cascade probe system accessories. 4. Semi-automated wafer probing in a high vacuum environment. Ordering Information Part Number Description 130377 PM8 manual analytical probe station, base machine with manual probe platen drive EPS200MMW 200 mm manual probing solution for mmW, THz and load pull applications, including: PM8 probe station with For a wide range of applications, the PA200 probe station powered by Velox software achieves high test efficiency. If you must violate any of the layout rules, please contact Cascade Microtech regarding the trade-offs and to verify that the footprint is a good layout for probing. No other probe card technology provides the flexibility to make high-performance DC and RF measurements from the same card. 5?. , as the world leader in microwave probes. ” SUMMIT200 Summit 12000 Summit 11000 BlueRay PM8/EPS200 Intended use IV/CV RF/ (mmW/THz) Failure analysis Wafer level reliability Niche production High-volume engineering mmW/THz IV/CV — — — Feb 4, 2008 · Cascade Microtech's advanced Pyramid probe card technology is unique in its ability to make these low-level DC measurements while at the same time facilitating RF measurements in a single solution. FormFactor opens new manufacturing facility in Livermore, CA, USA to expand capacity for semiconductor wafer probe card production. 18 in) /142 mm (5. com • Complete solutions using probe positioners and production probe cards • Versatile microscope mount system for fine-structure and large-area probing • Full thermal range of -60°C to +300°C Explore our 200 mm probe station for semi-automated, to fully automated, wafer probing. probe card holder for Cascade Summit 11000 probe stations, accommodates probe cards 4. Cascade Microtech’s Pyramid® Probes RBI Probe Cards and Cores Test Head to Probe Card Interface: Pogo Pins Erik Jan Marinissen | IEEE European Test Symposium (ETS’16) – Amsterdam, the Netherlands – May 24-26, 2016 16 4. Learn more! It features excellent probe-tip visibility and the lowest loss available. volume, large site count probing. This is the case e. May 29, 2017 · After several years of intense collaboration between imec and Cascade Microtech, partly supported by the EU-funded FP7 SEA4KET project, good results were achieved with Cascade Microtech’s Pyramid Probe prototype RBI probe cards on imec’s 300mm wafers with 40µm-pitch micro-bumped chips. 3gm/um, 1. • Cascade Microtech’s membrane-based Pyramid Probe card has long been one of the leading probe card technologies in the RF space. To provide highly accurate characterization of RF power devices at wafer level, the |Z| Probe® Power, based off proven |Z| Probe technology, handles high power at high frequencies (up to 40 GHz). It is ideal for failure analysis (FA), device characterization and modeling from DC to 500 GHz. 300 mm Probe Station with Integrated Silicon Photonics Wafer and Die-Level Probing Solution. This will make it even easier to configure your individual probe solution for current and future needs at an incredible price. • Cantilever and buckling beam probe cards are manually assembled • Assembly processes limit the probe pitch and number of pins • In general, the probe card costs tends to be proportional to the number of contactors CANTILEVERED PROBES VERTICAL PROBES “Conventional” Contactor Technology Stillman, et al. The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety. probe card length (standard) 284 mm (11. FormFactor broadens its products with several new product introductions, including new products in quantum cryogenics, logic probe cards, and high power probe systems. “Cascade 200 mm wafer probing systems have the precision and versatility needed for advanced semiconductor processes and aggressively scaled devices. Brandon Mair 3 Advanced manual cryogenic wafer probing < 7 K. Jun 21, 2013 · Product Description Cascade Microtech’s 3D probing solution, comprising the CM300 probe station and Pyramid Probe® cards with RBI technology, captures the true electrical performance of devices and helps produce high-integrity data. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz Jul 6, 2021 · In this paper, consistent and repeatable test results are obtained in a fully automatic manner using custom DC positioners with theta-X planarizing capability and true Kelvin probes for micro-bump resistance measurements as well as standard DC probes for wafer surface leakage measurements. Its unique design offers superior guarding and shielding over-temperature, overcoming the high-temperature performance limitations of standard coaxial needles. Aug 14, 2017 · ISS Map 103-726 - ISS Map 103-726 Created: August 14, 2017 | Updated: August 14, 2017 | Type: pdf | Size: 331. The |Z| Probe® patented technology assures high-accuracy measurements with low contact resistance and superior impedance control. Testimonial Wafer probing is Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber. 20 in. 0 mm (0. For example, the Cascade Pyramid Probe-Card uses a photolithographic process to define The RF probes use Air Coplanar technology to produce a rugged microwave probe with a compliant tip for accurate, repeatable measurements on-wafer. A probe card technology is described that addresses the needs of testing VLSI devices at the wafer level. 375" long. 08 mils)* standard moves ± 3 μm (0. Quietest cables in the Industry. “LuPo” High Voltage / High Power Probe Cards Cards can be configured up to 104 probes in either single or dual layer with near vertical probes to minimize scrub lengths on pads allowing the VC43s to probe pads as small as 30 microns. It can be extended probe card life time with no abrasive removal. The CM300 achieves hands-off productivity to probe 3D stacked devices, using PTPA to successfully probe 25µm diameter micro-bumps. 15 in) from probe center to front/rear FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. Probe Card Cleaning 101 – Protecting Your Probe Card Investment. The RBI probe tips require less than 1 gf/tip to make proper electrical contact. Velox WinCal eVue Microscope Positioners Chucks Vibration Isolation Tables ShieldEnclosure Custom Probe Systems Certified Used Equipment Trade-in/Buy Back Educational Savings Infinity Probe (145 GHz) InfinityXT Probe (110 GHz) |Z| Probe (67 GHz) |Z| Probe® Power T-Wave Probe (140 GHz-1. We also produce thin-film probe cards for production-level on-wafer testing. The CM300xi probe station offers measurement accuracy and reliability in a solution that is completely modular – whether it is I-V/C-V, RTN and RF measurements in one semi-automated system, or a fully-automated dual-prober system that handles any combination of 200 mm and 300 mm wafers. 59 in) from probe center to front/rear Max. With the recent purchase of Cascade Microtech by FormFactor, there is now the opportunity to evaluate some of FormFactor’s technologies for high speed. In 1988, GGB Industries, Inc. 3 gm/um • VX4 • Easy to use probe card holder for fast change of probe card Overview The Cascade PAC200 from FormFactor is the ideal solution for automatic testing of wafers and substrates up to 200 mm in a cryogenic environment down to 77 K with liquid nitrogen or below 20 K with liquid helium. ) Repeatability ≤ 3 μm (0. 5 days ago · FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. Mechanical Performance (continued) Z Stage Theta Stage ± 2 μm (0. It supports a wide range of applications, including DC and RF FormFactor’s Hikari probe card solution delivers excellent light uniformity, low power noise within the DUT and across the array, with minimal pad damage. This reliable low resistance contact is one of the keys to providing highly repeatable measurements. • As an additional option, motorized positioners allow automatic drift correction for each probe individually and facilitate unattended testing on small pads FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. Platform General The QuadCard probe card is the industry’s first configurable, multi-quadrant probe adapter that employs innovative fine probe aligners to mount up to four FormFactor probes on a single probe card. laser cutters, probe card holders ReAlign™ enables unattended testing over multiple temperatures for probe cards on the CM300xi probe station by automatically aligning probes to pads, utilizing three system-integrated cameras. 3 gm/um • VX4 Thermally induced drift can be automatically re-aligned for 30 μm pads in a temperature range from -40°C to 150°C (the effective temperature range depends on pad size, probe card holder and probe card) Enables unattended tests on small pads down to 30 μm over time and at multiple temperatures; Faster time to data The LWP series Lightwave Probe enables optical measurements for on-wafer and hybrid photonics devices. “LuPo” High Voltage / High Power Probe Cards. Volume pricing is available. Jun 24, 2016 · Cascade Microtech’s leading-edge stations, probes, probe cards, advanced thermal subsystems and integrated systems deliver precision accuracy and superior performance both in the lab and during production manufacturing of high-speed and high-density semiconductor chips. By Anne Meixner - 10 Sep, 2024 Advanced mm-Wave And Terahertz Measurements With Cascade Probe Stations. 1 THz on a Cascade EPS200MMW manual probe station with THz SIGMA Kit. Promises and Perils of Parallel Test. The RF/Microwave signal makes only one transition to the coplanar contact structure within the shielded, air-isolated probe body, maintaining signal integrity at temperatures as low as 4 K, or as high as 300°C. 125?thick, up to 11. Mar 22, 2018 · MEMS probes are the integral elements of our advanced wafer probe cards. Sub-THz measurements with the Infinity Probes®. The CM300xi-SiPh 300 mm probe station is the first verified integrated measurement solution on the market that enables engineering and production-proven, optimized optical measurements right after installation – without further development. g. 060-0. Engineered for high stability and accuracy, FormFactor s positioners enable precise, backlash-free and repeatable probe tip placements - from simple I V/CV measurements to highly challenging measurement tasks. This technology offers the ability to test high-pin count devices at operating speed with the same performance as obtained in package test. The eVue V is the latest edition of FormFactor’s leading-edge digital imaging system. Aug 15, 2017 · Probe Station Accessory Catalog. Jun 8, 2001 · About Cascade Microtech, Inc. Maintains 50-ohm environment which allows accurate high-frequency measurement of microelectronic modules; Compliant tips allow probing of non-planar structures; BeCu tips provide longer probing life and reduce probe damage; Access contacts close to components, module walls, or other obstructions Jun 14, 2017 · 在芯片的晶圆代工完成后与封装完成前，往往还需要用到探针卡(probe card)做功能测试。随着芯片的工艺越来越先进，以及新的MEMS层出不穷，探针卡这种以前很多家供应商可以提供的业务，在新的工艺时代，变成了少数企业才能完成。 These probe cards contain an IC-design-specific probe core which includes a thin film with MEMS-type probe tips (see Figure 4b). Pre-bond testing is important to increase the Aug 15, 2017 · PA300 Data Sheet. Manufacturer: Cascade Cascade Microtech probe 115-418 card holder for microchamber with clamp holder Back pivoting edge connector Maintains a dark and dry EMI-RFI shielded environment Stable 3 point planarization theta micrometer c The optional ReAlign™ feature offers the capability to perform “off-axis” probe to pad alignment independent from the main eVue microscope. CASCADE MicroTech 150mm Probe Station Series Description The M150 Measurement Platform is a high-performance probing station that allows for precision electrical measurements, from DC to hgih-frequency RF. Manufacturer: Cascade; Cascade Microtechprobe 115-418 card holder for microchamber with clamp holder Back pivoting edge connector Maintains a dark and dry EMI-RFI shielded environment Stable 3 point planarization theta micrometer c Apr 9, 2008 · The P30 Pyramid Probe card for RF filter and RF switch test is available for order immediately. Semi-/fully- automated cryogenic wafer probing down to 10 K The PAC200 is a highly-precise semi-automated probe station for wafers and substrates up to 200 mm (with a 300 mm option) in a high vacuum environment, at cryogenic temperatures down to 77 K with liquid nitrogen or down to 10 K with liquid helium. In addition, the training team will assess the operating environment of the probe card and provide recommendations for optimal performance. A fully automatic test system for characterizing advanced probe cards able to probe on large-array fine-pitch micro-bumps (such as JEDEC's Wide-I/O Mobile DRAM interfaces [1, 2]) has been specified, developed, installed, and brought to a full-operational state. Aug 3, 2017 · Verify that pad pitch matches available probe pitch (see Probe Selection Guide). Microscopes Microscope Objectives RF Positioners DC Positioners: Probe Card Holders Thermal Systems Vibration Isolation Tables Feb 21, 2021 · Probe card holder for Cascade Summit 11000 probe stations, accommodates probe cards 4. The probe cards are becoming more pin-counter and narrower in pitch with the recent improvement in semiconductor performance. 9gm/um • RBI Probe Card – Microbump probe card – ~100 probes, limited electrical connections –40 micron minimum pitch –Spring rate ~= 0. The frequency extenders are 1. The system can accommodate up to 150 mm wafers (or smaller samples), which are held in place by a vacuum chuck. Cascade Probe Card Holder 115-418 for Summit 11XXX and 12XXX series Probers with microchamber. The |Z| Probe Power provides excellent contact repeatability and extremely low contact resistance to deliver accurate results in load-pull May 5, 2022 · Velox WinCal eVue Microscope Positioners Chucks Vibration Isolation Tables ShieldEnclosure Custom Probe Systems Certified Used Equipment Trade-in/Buy Back Educational Savings Infinity Probe (145 GHz) InfinityXT Probe (110 GHz) |Z| Probe (67 GHz) |Z| Probe® Power T-Wave Probe (140 GHz-1. 1 THz models from Virginia Diodes and probes are Cascade T-Wave Probes. High Power Probes for TESLA200 Ultra High Power Probe High-Current Probe High-Voltage Probe Probe UHP HCP-XX HVP-XX Current Up to 300 A Up to 100 A Up to 5 A Voltage Up to 10,000 V Up to 500 V Up to 3,000 V *See High-Power Probe data sheet for more information. The Air Coplanar Probe (ACP) is a rugged microwave probe with a compliant tip for accurate, repeatable measurements for both on-wafer as well signal integrity applications. ReAlign™ enables unattended testing over multiple temperatures for probe cards on the CM300xi probe station by automatically aligning probes to pads, utilizing three system-integrated cameras. Instructional and How-to Videos: Installing and Adjusting Tilt - the Universal Probe Card Holder Nov 29, 2018 · 3 Recommended Abrasive Cleaning Media for Online Pyramid Probe Cleaning. Therefore, Cleaning sheets are of increasing importance as it extend the life of expensive probe cards. Probe Polish™ uses a highly cross-linked polymer which is non-conductive, non-corrosive, and has an FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. Jul 21, 2017 · Form Factor offers a wide selection of engineering probes to meet the highly demanding and broad range of on-wafer and signal integrity applications. Hinges allow Cascade’s Probe Card Holder to tilt up for easy probe card insertion. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz • Probe connection made at front of panel • Simple to re-arrange cabling when needed Platen lift • Easy and safe contact and separate function for probe cards and positioners • Available micrometer adjustment to set probe card contact • Probe and device safety interlock TopHat™ • New TopHat covers for easier and higher-accuracy Standard interface Probe card holders, custom adapters and TopHat™ Probe Card Holder* Probe card shape Rectangular Probe card width 114. probe card length (HTS) 160 mm (6. Standard interface For MicroChamber, TopHat, probe card holders and custom adapters Platen Lift Type Precision 4-point linear lift Range 5. The PA300 is a precise and flexible semi-automatic test solution for wafers and substrates up to 300 mm. However, the probe card cannot continue to function without cleaning the probe parts after a certain period of using. used. The QuadCard probe card accommodates a combination of up to 4 reliable and high performance probes. In addition to available probe stations, our SourceOne program also offers a wide range of accessories to meet your needs. Cables are designed and manufactured by Celadon. Probe Clean® Probe Clean® removes loose contamination and adherent debris from probe tips during probing. It is recommended especially for applications with limited microscope view, such as vertical and Pyramid probe cards, or when using a test head. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz Standard interface Probe card holders, custom adapters and TopHat™ Probe Card Holder* Probe card shape Rectangular Probe card width 114. The Probe Card provides up to 48 low-leakage probes for measurements below 5 fA. It is designed to accommodate a combination of our probes such as Infinity Probes®, ACP probes, |Z| Probes® and Multi-|Z| Probes, which are EquipX inc www. wide, 0. T. Entry-level manual cryogenic wafer probing < 7 K. 5 in. equipx. 1 THz) ACP Probe (110 GHz) Infinity Waveguide (50-500 GHz The |Z| Probe® patented technology assures high-accuracy measurements with low contact resistance and superior impedance control. Celadon’s proven AttoFast™ technology has been integrated into the VC43™ probe card resulting in superior leakage performance, low and more stable Velox WinCal eVue Microscope Positioners Chucks Vibration Isolation Tables ShieldEnclosure Custom Probe Systems Certified Used Equipment Trade-in/Buy Back Educational Savings Infinity Probe (145 GHz) InfinityXT Probe (110 GHz) |Z| Probe (67 GHz) |Z| Probe® Power T-Wave Probe (140 GHz-1. WinCal XE calibration software runs directly on a 67GHz PNA from Keysight Technologies. Optional micrometer control for fine adjustment of probe card contact. All probe stations are updated with new software, and can be customized to suit your application. for vertical and Pyramid probe cards. , revolutionized on-wafer microwave probing with a new patented coaxial microwave probe having 50 ohm coplanar flexible tips. Specially designed for laboratory requirements, it supports a wide range of May 24, 2017 · Leuven (Belgium) – May 24, 2017 – Imec, the world-leading research and innovation hub in nano-electronics and digital technologies, and Cascade Microtech, a FormFactor company and worldwide leader in advanced wafer-probe solutions, today announced the successful development of a fully-automatic system for pre-bond testing of advanced 3D chips. Jamming five spells for 10 mana, with one of them guaranteed to be a fearsome hydra , ends games quicker than you’d think. 30 in) / 80 mm (3. 5 mm (4. Featuring a new 2D MEMS spring and contact tip, the Takumi CL offers a consistent small scrub mark over the life of the product, with the benefits of low cost and fast manufacturing lead time. In this post we’ll address online cleaning methods of a Pyramid Probe. Cables are available in lengths custom to the half-meter, and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. I. It features excellent probe-tip visibility and the lowest loss available. 12 mils)* large moves Measured at edge of 200 mm chuck Platen System Platen Material Steel for magnetic positioners Mounting system Accessory compatibility Minimum of 8 DC or 4 RF positioners allowed, compatible simultaneous probe card holder use Integrated laminar-flow air-cooling for FormFactor’s Contact Intelligence combines smart hardware design, innovative software algorithms and years of experience to optimize probe contact accuracy on-wafer -- enabling true, autonomous test. These are used to characterize most new devices in the high-speed telecommunications, SONET, and LCD market segments. ejly hjytz ignrfto pgfnbqej dlyti czttjrh hcfvpl yrm bfasp ogln